Cristin-resultat-ID: 1451725
Sist endret: 23. februar 2017, 03:05
NVI-rapporteringsår: 2016
Resultat
Vitenskapelig artikkel
2016

Deposition of Cobalt Doped Zinc Oxide Thin Film Nano-Composites Via Pulsed Electron Beam Ablation

Bidragsytere:
  • Asghar Ali
  • Patric Morrow
  • Redhouane Henda og
  • Ragnar Fagerberg

Tidsskrift

MRS Advances
ISSN 2059-8521
e-ISSN 2059-8521
NVI-nivå 1

Om resultatet

Vitenskapelig artikkel
Publiseringsår: 2016
Volum: 1
Hefte: 6
Sider: 433 - 439

Importkilder

Scopus-ID: 2-s2.0-85016401148

Beskrivelse Beskrivelse

Tittel

Deposition of Cobalt Doped Zinc Oxide Thin Film Nano-Composites Via Pulsed Electron Beam Ablation

Sammendrag

This study reports on the preparation of cobalt doped zinc oxide (Co:ZnO) films via pulsed electron beam ablation (PEBA) from a single target containing 20 w% Co on sapphire (0001) and silicon (100) substrates. The films have been deposited at various temperatures (350оC, 400оC, 450оC) and pulse frequencies (2 Hz, 4 Hz), under a background argon (Ar) pressure of about 3 mtorr, and an accelerating voltage of 14 kV. The surface morphology has been examined by atomic force microscopy (AFM) and scanning electron microscopy (SEM). According to SEM analysis, the films consist of nano-globules whose size is in the range of 80-178 nm. Energy dispersive x-ray spectroscopy (EDX) reveals that deposition is congruent and the prepared films contain ∼20±5 w% cobalt. It has been found that the nano-globules in the deposited films are cobalt-rich zones containing ∼70 w% Co. From x-ray photoelectron spectroscopy (XPS) analysis, Co 2p3/2 peaks indicate that the deposited films contain CoO (binding energy = 780.5 eV) as well as metallic Co (binding energy = 778.1-778.5 eV). X-ray diffraction (XRD) analysis supports the presence of metallic Co hcp phase (2ϴ = 44.47° and 47.43°) in the films.

Bidragsytere

Asghar Ali

  • Tilknyttet:
    Forfatter
    ved Canada

Patric Morrow

  • Tilknyttet:
    Forfatter
    ved Canada

Redhouane Henda

  • Tilknyttet:
    Forfatter
    ved Canada

Ragnar Fagerberg

  • Tilknyttet:
    Forfatter
    ved Materialer og nanoteknologi ved SINTEF AS
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