Cristin-resultat-ID: 1775401
Sist endret: 16. mars 2022, 12:07
NVI-rapporteringsår: 2019
Resultat
Vitenskapelig Kapittel/Artikkel/Konferanseartikkel
2019

Eddy Current duplex coating thickness Non-Destructive Evaluation augmented by VNA scattering parameter theory and Machine Learning

Bidragsytere:
  • Karsten Husby
  • Tor Andre Myrvoll og
  • Ole Øystein Knudsen

Bok

2019 IEEE Sensors Applications Symposium (SAS)
ISBN:
  • 978-1-5386-7713-1

Utgiver

IEEE (Institute of Electrical and Electronics Engineers)
NVI-nivå 1

Om resultatet

Vitenskapelig Kapittel/Artikkel/Konferanseartikkel
Publiseringsår: 2019
ISBN:
  • 978-1-5386-7713-1

Importkilder

Scopus-ID: 2-s2.0-85065924474

Klassifisering

Fagfelt (NPI)

Fagfelt: IKT
- Fagområde: Realfag og teknologi

Beskrivelse Beskrivelse

Tittel

Eddy Current duplex coating thickness Non-Destructive Evaluation augmented by VNA scattering parameter theory and Machine Learning

Sammendrag

A Vector Network Analyzer (VNA) is used to reduce errors in equipment for Eddy Current Testing (ECT). After performing a standard 1-port calibration in the magnetic domain the measurements become practically free from drift and systematic errors and therefore easier to interpret. In addition, the linear equations used for VNA calibration is utilized to realistically randomize training data for machine learning. After training the AI algorithm accurately detects the thickness of duplex coatings used for corrosion protection of carbon steel substrates. The accuracy in terms of standard deviation relative to full scale is better than 13% without the need for tedious recalibration. The method becomes fast and well adapted for robot-assisted use. In addition, the method will be put to test for weld inspection, crack detection and wall thickness measurements.

Bidragsytere

Karsten Husby

  • Tilknyttet:
    Forfatter
    ved Sustainable Communication Technologies ved SINTEF AS

Tor Andre Myrvoll

  • Tilknyttet:
    Forfatter
    ved Sustainable Communication Technologies ved SINTEF AS

Ole Øystein Knudsen

  • Tilknyttet:
    Forfatter
    ved Materialer og nanoteknologi ved SINTEF AS
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Resultatet er en del av Resultatet er en del av

2019 IEEE Sensors Applications Symposium (SAS).

Depari, Alessandro; Michele, Magno; Benoit, Miramond. 2019, IEEE (Institute of Electrical and Electronics Engineers). Vitenskapelig antologi/Konferanseserie
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