Walker, David; Ahuir-Torres, Juan I.; Akar, Yasemin; Bingham, Paul A.; Chen, Xun; Darowski, Michal; Fähnle, Oliver; Gambron, Philippe; Jackson, Frankie F.; Li, Hongyu mfl.. 2023, Nanomanufacturing and Metrology. SHU, CCLRC, LJMU, HUD, HIoT, SVEITS, STORBRITAN, UIA, CCLRCDARESVitenskapelig artikkel