Synthetic Schlieren (SS) is a measurement technique that measures
changes in a density gradient field using the refraction of light. The technique is a digital version of the original Schlieren technique developed by Toepler
and Focault independently in the late 1800's. This technique was based on
an elaborate optical setup featuring a knife edge placed at the focal point of
the experiment. The knife edge would serve to mask out light rays that were
refracted in one direction, whereas light rays refracted in the other direction
would remain. Hence, the resulting image would contain bright and dark
patches depending on the refractive index variations.
The digital version of Schlieren was first published by a group at Cambridge
University (Dalziel et al, 1998) and subsequently by a group in Göttingen
(Meier, 1999), independently. Their version of the Schlieren technique is
based on imaging a known background pattern located behind an optically
transparent experiment section. Refractive index changes in the experiment
will give rise to apparent displacements of the background pattern, and
hence, by applying pattern matching principles one may calculate the depth
integrated density gradient field.
Up until now Synthetic Schlieren has relied on acquiring two subsequent
images of the background pattern with a known time spacing and there
has been no way of acquiring instantaneous measurements. This
may, for example, be highly important when the density gradients in
the experiment changes with both motion of the fluid and temperature
variations. Furthermore, for very long time-series, the original Synthetic
Schlieren concept will see a significant impact of temporal fluctuations in the
surroundings, such as the air in a laboratory.
The primary objective of the present proposal is to develop and publish
a technique that enables instantaneous density gradient measurements.
Secondarily, the project will generalize the pattern matching principles of
Synthetic Schlieren.