Detector Resolution Effects in Measuring Microstructured Beam Profiles

The purpose of the “3DMiMiC” project [1] is twofold. The first aim is to develop high resolution silicon detectors for the fast monitoring of microstructured synchrotron beams. The second aim is to develop silicon microdosimeters. Here, we address the resolution requirements of monitoring devices. Microstructured X-ray beams are resulting from synchrotoron radiation passing through masks with slits of very narrow widths [2]. The purpose of the monitoring system is to provide reliable intensity profiles, and estimates of the Peak to Valley Dose Ratios (PVDR). By (semi)analytical means we study the effects on the measurements due to finite resolution functions of different shapes. We also make case studies of a few PVDR measurements from the literature [2],[3], to understand if resolution effects would alter the conclusions made. References [1] http://www.sintef.no/home/Information-and-Communication-Technology-ICT/Microsystems-and-Nanotechnology/Competence-and-services-/Silicon-radiation-sensors/3DMiMic/ Downloaded Feb 14th 2014 [2] E.Bräuer-Kirch et al.: ‘Potential High Resolution Dosimeters for MRT’, AIP Conf.Proc. 1266, 89 (2010). [3] M. Petasecca et al.: ‘X-Tream: A Novel Dosimetry System for Synchrotron Microbeam Radiation Therapy’, JINST 7 P07022 (2012)