Cristin-resultat-ID: 1213944
Sist endret: 2. februar 2015, 09:45
NVI-rapporteringsår: 2014
Resultat
Vitenskapelig artikkel
2014

Testbeam and laboratory characterization of CMS 3D pixel sensors

Bidragsytere:
  • Mayur Bubna
  • Daniela Bortoletto
  • Enver Alagöz
  • Alex Krzywda
  • Kirk Thomas Arndt
  • Ian P.J. Shipsey
  • mfl.

Tidsskrift

Journal of Instrumentation (JINST)
ISSN 1748-0221
e-ISSN 1748-0221
NVI-nivå 1

Om resultatet

Vitenskapelig artikkel
Publiseringsår: 2014
Volum: 9
Hefte: 7
Artikkelnummer: C07019

Importkilder

Scopus-ID: 2-s2.0-84905188442

Beskrivelse Beskrivelse

Tittel

Testbeam and laboratory characterization of CMS 3D pixel sensors

Sammendrag

The pixel detector is the innermost tracking device in CMS, reconstructing interaction vertices and charged particle trajectories. The sensors located in the innermost layers of the pixel detector must be upgraded for the ten-fold increase in luminosity expected at the High-Luminosity LHC (HL-LHC). As a possible replacement for planar sensors, 3D silicon technology is under consideration due to its good performance after high radiation fluence. In this paper, we report on pre- and post- irradiation measurements of CMS 3D pixel sensors with different electrode configurations from different vendors. The effects of irradiation on electrical properties, charge collection efficiency, and position resolution are discussed. Measurements of various test structures for monitoring the fabrication process and studying the bulk and surface properties of silicon sensors, such as MOS capacitors, planar and gate-controlled diodes are also presented.

Bidragsytere

Mayur Bubna

  • Tilknyttet:
    Forfatter
    ved Purdue University

Daniela Bortoletto

  • Tilknyttet:
    Forfatter
    ved Purdue University

Enver Alagöz

  • Tilknyttet:
    Forfatter
    ved Purdue University

Alex Krzywda

  • Tilknyttet:
    Forfatter
    ved Purdue University

Kirk Thomas Arndt

  • Tilknyttet:
    Forfatter
    ved Purdue University
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