The structural properties of the PANI/CSA conducting polymer system studied by synchrotron radiation surface diffraction

Polyaniline protonated with camphorsulphonic acid has received much interest, but its molecular and crystalline structure is still unclear. We undertook detailed studies of thin films cast from m-cresol and trifluoroacetic acid solutions. Such samples were subjected to diffraction measurements by use of the grazing incidence technique,applying the z-axis diffractometer at the BW2 beamline at HASYLAB. We obtained very important information concerning the anisotropy of the crystalline reflections. The results demonstrate the signficance of the solvents on the structural ordering, and the anisotropy we observed plays an important role in new attempts at modelling the crystalline structure.