Cristin-resultat-ID: 1783446
Sist endret: 7. juli 2022, 10:39
NVI-rapporteringsår: 2020
Resultat
Vitenskapelig Kapittel/Artikkel/Konferanseartikkel
2020

The Importance of Key Performance Indicators that Can Contribute to Autonomous Quality Control

Bidragsytere:
  • Ragnhild Eleftheriadis og
  • Odd Myklebust

Bok

Advanced manufacturing and automation IX
ISBN:
  • 9789811523410

Utgiver

Springer
NVI-nivå 1

Serie

Lecture Notes in Electrical Engineering
ISSN 1876-1100
e-ISSN 1876-1119
NVI-nivå 1

Om resultatet

Vitenskapelig Kapittel/Artikkel/Konferanseartikkel
Publiseringsår: 2020
Volum: 634
Hefte: .
Sider: 373 - 378
ISBN:
  • 9789811523410

Importkilder

Scopus-ID: 2-s2.0-85078490387

Klassifisering

Fagfelt (NPI)

Fagfelt: IKT
- Fagområde: Realfag og teknologi

Beskrivelse Beskrivelse

Tittel

The Importance of Key Performance Indicators that Can Contribute to Autonomous Quality Control

Sammendrag

Industrial manufacturing companies simultaneously work to improve the quality and reduce cost in their production processes. The level of quality of what is being produced is essential to succeed. Several types of techniques and applications are used to collect information from manufacturing processes and the quality of data is crucial. Today’s equipment has embedded systems, databases, sensors that gives both quantitative and qualitative information’s. For planning and control in a factory this is essential to give good visual control tools to the production processes. However, the amount of structured data is growing fast, and goal-oriented performance indicators are key to measure success of produced smart products. With focus on planning and variant deviations of processes, performance indicators and enhancement of equipment combined with data analytics and AI techniques, we can outline a possibility of Autonomous Quality Control. Autonomous quality control will therefore be a key to succeed in the digital era, implemented and used in the right way; it will give excellent quality control, planning and maintenance by use of Zero-Defect Manufacturing techniques.

Bidragsytere

Ragnhild Johnsen Eleftheriadis

Bidragsyterens navn vises på dette resultatet som Ragnhild Eleftheriadis
  • Tilknyttet:
    Forfatter
    ved SINTEF Manufacturing

Odd Myklebust

  • Tilknyttet:
    Forfatter
    ved SINTEF Manufacturing
1 - 2 av 2

Resultatet er en del av Resultatet er en del av

Advanced manufacturing and automation IX.

Wang, Yi; Martinsen, Kristian; Yu, Tao; Wang, Kesheng. 2020, Springer. SSPU, UOP, NTNUVitenskapelig antologi/Konferanseserie
1 - 1 av 1