Cristin-resultat-ID: 1783446
Sist endret: 7. juli 2022, 10:39
NVI-rapporteringsår: 2020
Vitenskapelig Kapittel/Artikkel/Konferanseartikkel

The Importance of Key Performance Indicators that Can Contribute to Autonomous Quality Control

  • Ragnhild Eleftheriadis og
  • Odd Myklebust


Advanced manufacturing and automation IX
  • 9789811523410


NVI-nivå 1


Lecture Notes in Electrical Engineering
ISSN 1876-1100
e-ISSN 1876-1119
NVI-nivå 1

Om resultatet

Vitenskapelig Kapittel/Artikkel/Konferanseartikkel
Publiseringsår: 2020
Volum: 634
Hefte: .
Sider: 373 - 378
  • 9789811523410


Scopus-ID: 2-s2.0-85078490387


Fagfelt (NPI)

Fagfelt: Generell teknologi
- Fagområde: Realfag og teknologi

Beskrivelse Beskrivelse


The Importance of Key Performance Indicators that Can Contribute to Autonomous Quality Control


Industrial manufacturing companies simultaneously work to improve the quality and reduce cost in their production processes. The level of quality of what is being produced is essential to succeed. Several types of techniques and applications are used to collect information from manufacturing processes and the quality of data is crucial. Today’s equipment has embedded systems, databases, sensors that gives both quantitative and qualitative information’s. For planning and control in a factory this is essential to give good visual control tools to the production processes. However, the amount of structured data is growing fast, and goal-oriented performance indicators are key to measure success of produced smart products. With focus on planning and variant deviations of processes, performance indicators and enhancement of equipment combined with data analytics and AI techniques, we can outline a possibility of Autonomous Quality Control. Autonomous quality control will therefore be a key to succeed in the digital era, implemented and used in the right way; it will give excellent quality control, planning and maintenance by use of Zero-Defect Manufacturing techniques.


Ragnhild Johnsen Eleftheriadis

Bidragsyterens navn vises på dette resultatet som Ragnhild Eleftheriadis
  • Tilknyttet:
    ved SINTEF Manufacturing

Odd Myklebust

  • Tilknyttet:
    ved SINTEF Manufacturing
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Resultatet er en del av Resultatet er en del av

Advanced manufacturing and automation IX.

Wang, Yi; Martinsen, Kristian; Yu, Tao; Wang, Kesheng. 2020, Springer. SSPU, UOP, NTNUVitenskapelig antologi/Konferanseserie
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